High-Frequency Measurements and Benchtop EMC Tests Course

Brought to you by Mach One Design 

This course is led by Dr. Min Zhang, a renowned EMC expert based in the UK, with technical support from Mr. Thomas Dowd of Telonic.

Course Objectives

This one-day course offers hands-on training for design engineers seeking a comprehensive understanding of high-frequency measurements and EMC tests. Unlike many other training programs that focus primarily on theory, this course emphasizes real-world applications, featuring numerous demonstrations using state-of-the-art test equipment and interactive sessions for participants.

Who Should Attend

It is recommended for electrical/electronics engineers with at least 2 years of work experience who aim to establish benchtop EMC testing capabilities and gain fundamental knowledge of EMC principles, along with the ability to perform accurate high-frequency measurements.

Course Location

Telonic Show Room https://youtu.be/4MtwABNwZnE?si=kPcJ-fzQl53gntl0


Regularly run, next scheduled for mid-February 2024. please contact us or Telonic for details.



  • Basics of EMC, EMI & CE/UKCA marking
  • An overview of various EMC tests

High-Frequency Measurement Theory

  • Transmission Line, Reflections, Terminations
  • Coupling Mechanisms – Conductive, Near-field & Radiated Coupling 
  • Frequency: Low vs. High, and why it matters to us with Demo
  • Common Mode vs. Differential Mode Noise with Demo
  • Contact vs non-contact Measurement with Demo
  • Coaxial Cable

Essential Tools with Demo

  • Fundamentals of Near-Field Probes
  • Fundamentals of RF Current Probes

Conducted Emissions with Demo

  • Fundamentals of Conducted Emissions
  • Test Setup in details, including detailed spectrum analyser operation guide
  • Results Analysis
  • Ensuring Safe Connections to Protect Front-End of a Spectrum Analyser 

Radiated Emissions with Demo

  • Fundamentals of Radiated Emission Tests
  • Understanding ¼ & ½ Wavelength Antennas
  • Test Setup with TEM-Cell, current probe and far-field antennas
  • Results Analysis

Immunity Tests with Demo

  • Fundamentals of Immunity Tests
  • Test Setup with CDN and BCI
  • Common Pitfalls in Immunity Testing

Transients with Demo

  • Surge
  • EFT/Burst
  • ESD 


About the Course Trainer 

Dr. Min Zhang is the founder and principal EMC consultant of Mach One Design Ltd (www.mach1design.co.uk), a UK-based engineering firm that specializes in EMC consulting, troubleshooting, and training. His in-depth knowledge of power electronics, digital electronics, electric machines, and product design has benefitted companies worldwide. Zhang can be reached at info@mach1design.co.uk

About Telonic

Telonic Instruments Ltd is an ISO9001:2015 registered company specialises in Test Instruments and Programmable AC and DC Power Supplies from industry leading manufacturers including Kikusui, Delta Elektronika, Lab-Power, ETL Pruftechnik, Rigol, Siglent, Brymen, Danisense, Tekbox, Graphtec, Sensepeek, Microtest, JBC and Micsig. Telonic has been supporting the electronics, automotive, aerospace, education, manufacturing, research and development sectors with sales, service, calibration and hire in the UK for over 50 years.

For Demonstrators ONLY

AC LISN for Conducted Emission Test Demonstration

Please note that due to the high voltage nature of AC LISN, this demonstration will be conducted exclusively by our team. Course participants will have the opportunity to perform conducted emission tests with a DC setup only.

ESD Troubleshooting 

With a 2 GHz Oscilloscope

Proposed Benchtop Set-Up for Course Participants

Set-Up 1: Conducted Emission Set-Up


DC Power Supply

DC Load

Spectrum Analyzer


RF Current Probes

DC-Powered Device Under Test (DUT) [to be determined]

Set-Up 2: Radiated Emission Set-Up

DC Power Supply

TEM Cell

RF Current Probe

Near-Field Probe Set


Spectrum Analyzer

DC-Powered Device Under Test (DUT) [to be determined]

Set-Up 3: Immunity Set-up

DC Power Supply

TEM Cell


BCI Probe

Near-Field Probe Set

Spectrum Analyzer

RF Amplifier

DC-Powered Device Under Test (DUT) [to be determined]

Set-Up 4: Advanced Troubleshooting:


Vector Network Analyzer (VNA)

Near-Field Probe Set

Pair of RF Current Probes

DC-Powered Devices Under Test (DUTs) [to be determined]